Abstract:

Scanning probe methods (SPM) allow the investigation of local physical and chemical properties down to the atomic scale, in addition to providing fascinating real-space views of atomic and molecular structures in the presence of defects or disorder. This lecture will focus on the basic principles of scanning tunnelling and atomic force microscopy and spectroscopy as well as on applications of these techniques in modern condensed matter physics, including the investigation of semiconductors, metals, insulators, superconductors, magnetic and molecular materials. Most recent exciting developments based on advanced SPM instrumentation working at ultra-low temperatures and high magnetic fields will be presented, revealing quantum effects directly in real space at very low energy scales. (Ref.: R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge 1994).